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Near-Infrared Spectroscopic Cathodoluminescence Imaging Polarimetry on Silicon Photonic Crystal Waveguides

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† Center for Nanophotonics, FOM Institute AMOLF, Science Park 104, 1098 XG Amsterdam, The Netherlands
‡ Centre for Quantum Photonics, H.H. Wills Physics Laboratory, University of Bristol, Tyndall Avenue, Bristol BS8 1TL, United Kingdom
§ School of Physics and Astronomy, Cardiff University, Cardiff CF24 3AA, United Kingdom
*E-mail (A. Polman): [email protected]
Cite this: ACS Photonics 2016, 3, 11, 2112–2121
Publication Date (Web):October 18, 2016
https://doi.org/10.1021/acsphotonics.6b00557
Copyright © 2016 American Chemical Society
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    Abstract

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    We measure polarization- and wavelength-resolved spectra and spatial emission intensity distributions from silicon photonic crystal waveguides in the near-infrared spectral range using spectroscopic cathodoluminescence imaging polarimetry. A 30 keV electron beam, incident along the surface normal of the sample, acts as an ultrabroadband and deeply subwavelength excitation source. For photonic crystal waveguides with a broad range of design parameters, we observe a dominant emission intensity distribution that is strongly confined to the waveguide. For a period of 420 nm and a hole radius of 120 nm, this occurs at a wavelength of 1425 nm. The polarization-resolved measurements demonstrate that this feature is fully linearly polarized along the waveguide axis. Comparing the modal pattern and polarization to calculations of the electric field profiles confirms that we measure the odd TE waveguide mode of the system. This result demonstrates that the electron beam can couple to modes dominated by in-plane field components in addition to the more commonly observed modes dominated by out-of-plane field components. From the emission directionality, we conclude that we sample a leaky portion of the odd waveguide mode.

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    The Supporting Information is available free of charge on the ACS Publications website at DOI: 10.1021/acsphotonics.6b00557.

    • Measured data from an additional sample, an input section of the waveguide studied here and for shorter wavelengths; 2D calculations for TM polarization, 3D calculations for TE polarization, and a comparison of the calculated field components of the even and odd waveguide modes; an explanation of the spectroscopic polarimetry method (PDF)

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