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Ambient Stabilization of Few Layer Phosphorene via Noncovalent Functionalization with Surfactants: Systematic 2D NMR Characterization in Aqueous Dispersion

  • Rishabh Jain
    Rishabh Jain
    National Creative Research Initiative Centre for Multi-Dimensional Directed Nanoscale Assembly, Department of Materials Science and Engineering, KAIST, Daejeon 34141, Republic of Korea
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  • Yashpal Singh
    Yashpal Singh
    Graduate School of EEWS, KAIST, Daejeon 34141, Republic of Korea
    More by Yashpal Singh
  • Soo-Yeon Cho
    Soo-Yeon Cho
    Department of Chemical and Biomolecular Engineering, KAIST, Daejeon 34141, Republic of Korea
    More by Soo-Yeon Cho
  • Suchithra Padmajan Sasikala
    Suchithra Padmajan Sasikala
    National Creative Research Initiative Centre for Multi-Dimensional Directed Nanoscale Assembly, Department of Materials Science and Engineering, KAIST, Daejeon 34141, Republic of Korea
  • Sung Hwan Koo
    Sung Hwan Koo
    National Creative Research Initiative Centre for Multi-Dimensional Directed Nanoscale Assembly, Department of Materials Science and Engineering, KAIST, Daejeon 34141, Republic of Korea
    More by Sung Hwan Koo
  • Rekha Narayan
    Rekha Narayan
    National Creative Research Initiative Centre for Multi-Dimensional Directed Nanoscale Assembly, Department of Materials Science and Engineering, KAIST, Daejeon 34141, Republic of Korea
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  • Hee-Tae Jung
    Hee-Tae Jung
    Department of Chemical and Biomolecular Engineering, KAIST, Daejeon 34141, Republic of Korea
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  • Yousung Jung
    Yousung Jung
    Graduate School of EEWS, KAIST, Daejeon 34141, Republic of Korea
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  • , and 
  • Sang Ouk Kim*
    Sang Ouk Kim
    National Creative Research Initiative Centre for Multi-Dimensional Directed Nanoscale Assembly, Department of Materials Science and Engineering, KAIST, Daejeon 34141, Republic of Korea
    *E-mail: [email protected]. Phone: +82-42-350-3339. Fax: +82-42-350-3310.
    More by Sang Ouk Kim
Cite this: Chem. Mater. 2019, 31, 8, 2786–2794
Publication Date (Web):March 19, 2019
https://doi.org/10.1021/acs.chemmater.8b04984

Copyright © 2019 American Chemical Society. This publication is licensed under these Terms of Use.

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Abstract

Phosphorene suffers from instability under ambient condition, despite its potential to bridge the gap between graphene and two-dimensional (2D) metal chalcogenides. We report effective exfoliation and stabilization of few layer phosphorene (FLP) in the presence of strongly interacting surfactants. Surfactants containing long hydrophobic chain and nonbulky charged headgroups (CTAB) effectively exfoliate and stabilize FLP in water, which is consistent with our density functional theory prediction. Nuclear magnetic resonance measurements are systematically employed to probe the interaction between surfactants and FLP. Retarded diffusion rate measured by 2D DOSY spectroscopy revealed the presence of noncovalently bonded CTAB over phosphorene. 2D NOESY spectroscopy further suggests the interdigitated arrangement of surfactants. Such a tight interaction impedes the ambient degradation rate of phosphorene by 70–80%. This work proposes a new insight into the control over ambient degradation of phosphorene without altering its intrinsic properties.

Introduction

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Phosphorene is an emerging 2D semiconducting material obtainable from black phosphorus (BP) crystals through various exfoliation methods. (1−11) The generic potential of phosphorene to fill the gap between graphene and 2D metal chalcogenides, along with its high charge mobility under semiconducting nature, is attracting a great deal of attention. (12) Moreover, many interesting properties of phosphorene, such as thickness dependent band gap (0.3 eV in bulk to 2.1 eV in monolayer), anisotropic electrical and optical properties, ambipolar type behavior, and negative Poisson’s ratio, can be versatile elements for optoelectronics, electronics, energy storage/conversion, sensors, biomedical applications, and so on. (13−17) Nonetheless, practical utilization of phosphorene is facing crucial bottlenecks, particularly arising from the instability under ambient condition. The presence of lone pair electrons in phosphorene readily induces the dissociation of oxygen molecules at phosphorene sheets and leads to the formation of P–O and P═O bonds. (18) Such degradation can be significantly enhanced in the presence of water, which reacts with phosphorus oxide and eventually yields phosphoric acid. (19)
A considerable amount of research efforts has been devoted thus far for the effective stabilization of phosphorene. Atomic layer deposition of oxide layers, (20) heterostructure formation with other 2D materials, (21−23) passivation by organic molecule, (24,25) polymer encapsulation, (26,27) and many other approaches have been exploited to this end. (12,28−31) Notably, aryl diazonium salts have been reported to suppress the degradation of phosphorene by covalent functionalization. (32) Phosphorene sheets could be stabilized over 25 days under ambient condition by the formation of a direct P–C bond. Covalent bond formation with titanium sulfonate (P–Ti) (33) or carbon nitride (P–C and P–N) (34,35) also has been found to stabilize phosphorene. Unfortunately, such a covalent bond formation significantly modifies the 2D crystalline lattice structure of phosphorene, which may result in the undesired influence on its material properties. A facile, eco-friendly method to stabilize phosphorene sheets without significant distortion of the crystalline lattice structure is a crucial demand for the further progress of this interesting 2D semiconductor.
In this work, we present the synthesis of few layer phosphorene (FLP) sheets with enhanced ambient stability by surfactant mediated liquid phase exfoliation in deoxygenated water. (36,37) Recently, Hersam et al. have introduced SDS assisted aqueous phase exfoliation of BP which resulted in the synthesis of concentrated, thinner, and optically active FLP. (7) However, controlled synthesis of FLP having enhanced ambient stability without affecting its intrinsic properties remained unresolved. Typically, ionic surfactants with a long hydrophobic chain (cetrimonium bromide (CTAB)) could facilitate an effective exfoliation of phosphorene by intercalating into BP layers and further suppress ambient degradation of FLP. Density functional theory (DFT) computation along with 1D and 2D nuclear magnetic resonance (NMR) experiment verified a strong noncovalent interaction between surfactants and phosphorene sheets. (38−40) We further demonstrated the gas sensing response of the exfoliated BP after the removal of surfactants and confirmed that the intrinsic gas sensing property of FLP is well-maintained.

Results and Discussion

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We synthesized FLP sheets by exfoliating BP in the presence of surfactants as depicted in Figure 1a. Deoxygenated water was used to minimize the oxidation of phosphorene during exfoliation and precisely explored the role of surfactants. Two typical surfactants, CTAB and tetrabutylammonium hydroxide (TBAOH), were used in this work with the concentrations ranging from 0.15 to 4 mM. The presence of an ionic group allowed surfactants to interact with the lone pair electrons of phosphorene, wherein surfactant with a long hydrophobic chain oriented laterally (at low concentration) or vertically (at high concentration) over the phosphorene surface (Figure 1a). Such an assembly greatly influenced the dispersibility of phosphorene in water so that highly concentrated surfactant solutions showed a noticeably stable dispersion as discussed below.

Figure 1

Figure 1. (a) Schematic procedure for the fabrication of FLPs. Photographical image shows aqueous dispersibility of FLP in different concentrations of surfactant. (b) TEM image of P/CTAB (inset shows SEM image; 400 nm scale). (c) HRTEM image of P/CTAB (inset shows SAED pattern). (d) Raman spectroscopy of FLP exfoliated in various surfactant media. (e) Variation in zeta potential of FLP with surfactant concentration. (f, g) XRD patterns of exfoliated P and P/CTAB (low and high conc.).

Figure 1b shows morphology of the FLP exfoliated in the deoxygenated water including CTAB (P/CTAB), which presents the formation of thin phosphorene sheets with well-defined edges. High resolution transmission electron microscopy (HRTEM) and selected area electron diffraction (SAED) of P/CTAB confirmed the orthorhombic crystalline structure of phosphorene with well-aligned lattice fringes remained intact during the exfoliation process (Figure 1c). Similarly, FLP sheets exfoliated in the surfactant-free, pure deoxygenated water (P), and those exfoliated in the presence of TBAOH (P/TBAOH) also showed high crystalline structures (Figures S1 and S2). The typical size of P/CTAB ranged from 800 nm to 3 μm, similar to those of P/TBAOH (500–1.5 μm) but larger than P (100–700 nm).
Thickness measurement of the FLP by atomic force microscopy (AFM) verified that CTAB assisted exfoliation dominantly yields thinner sheets (3–10 nm) than TBAOH assisted exfoliation (>20 nm) and surfactant-free exfoliation (>30 nm) (Figure S3). This signifies that the presence of linear hydrophobic chains and the absence of a bulky headgroup in CTAB, in contrast to TBAOH, allowed favorable interactions with phosphorene for the better intercalation capabilities within BP layers. Peak shifts in the Raman modes of phosphorene, A1g, B2g, and A2g, wherein the shift in A2g mode is most sensitive, along with the reduction of phosphorene thickness allow us to evaluate the exfoliation efficiency of surfactants. (19) Under the same concentration of surfactants, Raman spectroscopy of P/CTAB, deposited on a Si/SiO2 substrate, revealed higher shifts of the A2g peak (∼3.0–3.5 cm–1) than that of P/TBAOH (0.5 cm–1), confirming better intercalation capabilities (Figure 1d). Variation in the absorbance of phosphorene sheets at λ = 465 nm, characterized by UV–vis spectroscopy, may quantify the exfoliation yield (Figure S4). (41) A higher surfactant concentration during exfoliation led to a larger enhancement in the absorbance intensity with the noticeable increase of exfoliation yield from 2–3% to 10–18%. Absorbance intensity saturates at ∼2 mM surfactant concentration, followed by a gradual decrease, which is attributed to the strong association among surfactants that impeded intercalation and exfoliation capability.
While measuring surface charge states, we observed that FLP with a zeta potential (ζ) value of either ≥30 mV or ≤ −30 mV generally exhibited stable aqueous dispersibility over a week. At a concentration of 0.1 mg/mL, P showed a ζ change from −23 to −4.45 mV while using 0.15 mM CTAB during sonication. It is noteworthy that 0.15 mM TBAOH did not reveal any noticeable change (Figure 1e). Negative ζ of P is attributed to the lone pair electrons present in the phosphorene which enables temporal dispersibility in water for several days. (42) Strong interaction of these lone pair electrons with CTAB may alter the ζ and hamper dispersibility in water. However, further increase in the concentration of surfactant (0.15 to 4 mM) changed ζ to +50.93 for P/CTAB. Surprisingly, P/TBAOH showed a decrease of ζ from −23 to −53 mV with the increase in surfactant concentrations. Even having a similar ionic headgroup with CTAB, TBAOH caused the opposite sign of ζ, which is attributed to the strong adhesion of OH over P/TBA+, yielding a highly negative charge state. A similar effect of OH has been reported during the exfoliation of BP in alkaline N-methyl-2-pyrrolidone (NMP). (43) Scanning transmission electron microscopy (STEM) confirmed the presence of surfactant over the exfoliated phosphorene sheets (Figures S5 and S6).
The X-ray diffraction (XRD) spectroscopy (Figure 1f) presents an interlayer distance of 5.27 Å between phosphorene sheets when exfoliated in pure water (P, green color) with a single peak at 2θ = 16.8°. By contrast, introduction of CTAB in a low concentration (P/CTABlow, red color) led to a new peak at 2θ = 6.8°, indicating the increase in interlayer spacing to 12.9 Å (Figure 1g) due to the intercalation of CTAB with a lateral orientation along phosphorene surfaces. (44) Further increase in the CTAB concentrations (P/CTABhigh, blue color) resulted in an additional peak at 2θ = 4.54°, reflecting the further increase of interlayer distance to 19.5 Å (Figure 1g). This additional peak indicates vertically oriented CTAB molecules with a tilt angle of 55.1° within phosphorene sheet layers (length of CTAB is ∼25 Å). Such an orientation can be induced by self-assembly of CTAB molecules (Figure S7). By contrast, XRD results of P/TBAOHlow/high yield a pattern similar to P with no new peak (Figure S8), revealing poor intercalation capability of TBAOH.
Surfactant assisted liquid phase exfoliation of BP was initially undertaken by Hersam et al. for the synthesis of highly aqueous dispersible FLP. (7) However, they have used only single high concentration of surfactant, and therefore, the effect of various concentrations of surfactants on extent of exfoliation, aqueous dispersibility of FLP, mechanism behind high dispersibility, and orientation of surfactant over FLP remained obscured. However, the current study has systematically unraveled all of these aspects using various techniques, thus providing deeper fundamental insights. Our discovery of a titled interdigitated arrangement of surfactants over FLP as shown in Figure S7 revealed the basic mechanism behind high aqueous dispersibility of FLP. In order to develop a perfect model for the synthesis of FLP with enhanced ambient stability, we introduced systematic analysis to investigate the type of interaction and binding strength of surfactants to FLP.
We employed DFT computations for the adsorption energies of surfactants oriented vertically and laterally at phosphorene surfaces. Figure 2a,b displays the most stable geometries of laterally oriented CTAB and TBAOH over monolayer phosphorene sheets with the adsorption energies of −1.69 and −0.85 eV, respectively. CTAB adsorbed more strongly at phosphorene than TBAOH. The strong attraction of CTAB with phosphorene was due to (i) electrostatic interaction directly from the cationic headgroup (+N(CH3)3) toward the lone pair electrons of phosphorene, and (ii) dispersion interaction between long hydrophobic chain with phosphorene. The adsorption energies of vertically oriented CTAB (−0.66 eV) were found to be lower than those of laterally oriented surfactants (Figure S9). However, under aqueous dispersion, the vertically oriented structure can be strongly driven by additional hydrophobic interaction to avoid the undesired direct contact of hydrophobic chain of those surfactants with water. The presence of bulky alkane groups in TBAOH hindered the adsorption to phosphorene despite its similar headgroup with CTAB. In order to probe the effects from surfactants on the intrinsic properties of phosphorene, we examined partial density of states (PDOS) of pristine and surfactants adsorbed phosphorene (Figure S10). While PDOS of pristine phosphorene revealed a band gap of 0.82 eV, those of P/CTAB showed the band gap decreased to 0.67 eV. By contrast, for P/TBAOH, the band gap remained unaltered (Table S1). Further, Bader charge analysis (Figure S12) revealed that the phosphorene surface lost 0.46 electrons to CTAB. This indicates that noncovalent functionalization of phosphorene by CTAB led to a p-type doping effect which can be beneficial for electronic properties of phosphorene. (32) By contrast, phosphorene gained 0.15e in the vicinity of the TBAOH molecule (see Table S1 for details).

Figure 2

Figure 2. (a, b) DFT calculated structures of thermodynamically favored noncovalent binding of (a) CTAB and (b) TBAOH surfactants at phosphorene surface (insets show binding energies value). (c, d) 2D NOESY spectra of (c) P/CTAB, and (d) P/TBAOH dispersions in D2O. Assignments of resonances are indicated. Structures of (e) CTAB and (f) TBAOH representing various types of 1H protons present.

We systematically employed nuclear magnetic resonance (NMR) measurements to probe the nature of interaction between FLP with various surfactants in the aqueous dispersion state. Protonic NMR (1HNMR) only showed downfield or upfield chemical shift in surfactant resonances without any new prominent additional resonance (Figure S13). Therefore, we investigated transmission diffusion measurement using DOSY (more details are included with Figures S13 and S14). (45,46) For P/CTAB (Figure S14a), diffusion constant graphs predominantly showed two different peaks (D = 0.39 × 10–6 and 1.55 × 10–6 cm2/s), whereas those of pure CTAB (Figure S14b) showed a single peak at D = 1.42 × 10–6 cm2/s. The slower diffusion constant in P/CTAB is attributed to the noncovalently bound CTAB molecules at the phosphorene surface. (47) By contrast, the higher diffusion constant is associated with free CTAB molecules in the P/CTAB solution. (47) For P/TBAOH (Figure S14c), the diffusion constant graph revealed only a single narrow peak at D = 1.78 × 10–6 cm2/s, which was smaller than that of pure TBAOH (D = 2.13 × 10–6 cm2/s, Figure S14d). This result should imply a fast exchange between free and surface bound surfactants, wherein the measured diffusion constant correspond to the average of two different states. (45) Notably the decrease in the diffusion constants for P/CTABbonded was higher than that for P/TBAOH, supporting the stronger bindings of CTAB at the FLP surface (Table S2).
In order to effectively differentiate surface bound surfactants from free surfactants, the transfer nuclear Overhauser effect (tr-NOE) phenomenon was obtained through 2D NOESY spectra. On the basis of their cross-relaxation rates, noncovalently bound surfactants and free surfactants show highly negative and weakly positive NOE intensity, respectively. (48) In the 2D NOESY spectrum, negative (positive) NOE leads to cross-peaks with the same (opposite) signs as of the diagonal peak, and thereby, the presence of surface bound surfactants can be easily distinguished (detailed information in the Supporting Information). (49)
The 2D NOESY spectra of P/CTAB and P/TBAOH dispersions (Figure 2c,d) showed several cross-peaks with highly negative NOE (highlighted) values, which were absent in NOESY spectra of pure CTAB or TBAOH dispersions (Figure S15a,b). This indicates the presence of bound surfactants at phosphorene sheets. In P/CTAB, cross-peaks between the protons of the long hydrophobic chain (−(CH2)12– and γ-(CH2)−) with β-CH2 protons and terminal −CH3 protons is attributed to their close proximity (in CTAB structure (Figure 2e)). With a similar reason, 2D NOESY showed cross-peaks between protons of β-(CH2) and protons of headgroup −N(CH3)3–. Interestingly, cross-peaks between protons of headgroup −N(CH3)3– and protons of the long hydrophobic chain and terminal −CH3–, which are not in close proximity, further verified the presence of surface bound surfactants with their orientation at FLP surfaces. Due to the close proximity of protons of headgroup and terminal −CH3– protons, the probability of having a bilayer of surfactant over phosphorene can be ruled out. Therefore, two major possibilities of surfactant orientation over phosphorene can be deduced: (1) Interdigitated arrangement, and (2) random lateral arrangement. As discussed above, P/CTAB consisted of both interdigitated arrangements and lateral orientation of CTAB molecules. Cross-peaks between the protons of those group, which are far from each other in the CTAB structure, can be due to the interdigitated arrangement.
P/TBAOH also showed various cross-peaks with a highly negative NOE intensity (Figure 2d), which were not observed in the TBAOH dispersion (Figure S15b), that confirmed the presence of surface bound TBAOH. All the cross-peaks that appeared in the 2D NOESY spectra of P/TBAOH are attributed to the close proximity of protons with each other in the TBAOH structure (Figure 2f). Due to the absence of a long linear hydrophobic chain, a lateral orientation of TBAOH was deduced over the phosphorene surface, as illustrated in Figure 2b. Systematic DFT calculations and NMR studies, a new insight in phosphorene research, not only revealed the existence of noncovalent functionalization but also quantifies the binding strength of surfactants to FLP. These techniques further differentiate the mechanism of interaction in P/CTAB and P/TBAOH and demonstrate the role played by surfactant structure in providing high binding strength. After understanding the basic insights in surfactant chemistry with FLP, we were able to develop a perfect model for the synthesis of FLP with enhanced ambient stability.
High instability of phosphorene under ambient condition is attributed to the presence of reactive lone pair electrons. Formation of large bubbles and pits over pristine phosphorene sheets is commonly observed within a day of ambient exposure. (50) Noteworthy, only a tiny bubble formation was observed at P/CTAB for 15 days (Figure 3d), followed by a slow increment of bubble size for a further 35 days (Figure 3f). By contrast, while checking the stability of P/TBAOH, we noticed significant bubble formation after 5 days of ambient exposure, followed by complete degradation of FLP after 7 days (Figure S16). Such a difference in ambient stability is obviously attributed to the strong interaction of FLP with CTAB in comparison with TBAOH as verified by DFT computations (Figure 2a,b).

Figure 3

Figure 3. (a–f) SEM images of P/CTAB when exposed to ambient condition over 35 days. (g–i) XPS analysis of (g) P, (h) P/CTAB), (i) P/TBAOH when exposed to ambient condition over 21 days. Inset shows XPS analysis of oxidized phosphorene (POx) for 21 days. (j) Quantitative analysis of degradation rate in P (black), P/CTAB (red), and P/TBAOH (inset, blue) for 21 days.

High resolution P 2p XPS spectra for all samples, over 21 days of ambient exposure, showed a prominent peak at 129.1 eV and a shoulder peak at 130.5 eV, which correspond to the 2p1/2 and 2p3/2 of P–P bonds, respectively (Figure 3g–i). Another peak between 132 and 135 eV corresponds to the oxidation of FLP (POx), the intensity increase of which quantifies the degradation rate of phosphorene. We noticed a gradual increase in the intensity after 1 day, which verified the rapid degradation of phosphorene exfoliated in pure deoxygenated water (P) in contrast to P/CTAB. Figure 3j shows, quantitatively, degradation rate of P, P/CTAB, and P/TBAOH. Among all degradation rates, P/TBAOH was found to be the highest presumably due to the presence of OH, which can readily react with P to form POx. Moreover, a smaller POx/P-P area ratio in P/TBAOH (0.25) when compared with P (0.35) for day 1 indicates the possibility of OH to further catalyze the degradation by reacting with already formed POx. TBAOH also tends to donate electrons (0.15e) to the phosphorene surface as confirmed by Bader charge analysis (Figure S12b and Table S1), which renders phosphorene electron rich and also more reactive toward ambient oxygen. Lastly, due to the bulky alkane groups, TBAOH was unable to bind strongly with phosphorene and thus hardly protected it from ambient oxygen and humidity.
Apart from the intensity enhancement, we also observed upward shift in the POx peak, which is quite noticeable for P/TBAOH (∼0.8 eV) in comparison with P (∼0.5 eV) and P/CTAB (∼0.2 eV). Such an upward shift in the POx peak measures the degradation rate, as caused by the change in oxidation state of phosphorus from +2 to +5 during the degradation of phosphorene sheets. (51) The degradation rate decreased significantly (70–80%) with the addition of CTAB and can be reduced further by optimizing surfactant concentrations (Figure 3j). The retarded degradation rates of P/CTAB can be attributed to four main reasons, (1) Strong noncovalent bonding of CTAB on FLP, (2) slow or no exchange with free surfactants, (3) long hydrophobic chain that prevents humidity to react with phosphorene sheets, and (4) making phosphorene electron deficient. Hence, our method of synthesis of FLP with superior ambient stability is efficient in comparison with the atomic layer deposition of oxide layers, passivation by organic molecule, and polymer encapsulation method reported previously. Comparable results were obtained in comparison with covalent functionalization and the recently reported supramolecular network method (Table S3).
We tested gas sensing performance of our exfoliated FLP as a typical application of semiconducting properties. (52) To achieve a reliable sensing performance, highly stable exfoliation and protection of FLP are critically required. Concurrently, any capping agents at FLP surfaces should be readily removable to exploit the intrinsic surface characteristics of FLPs. (8) In this regard, vacuum filtration of aqueous dispersions, followed by thorough water rinsing, was employed for highly pure FLP based films. (53,54) The absence of low angle peaks (4.54° and 6.8°) in XRD (Figure 1g) for P/CTAB films after filtration and water rinsing indicates that surfactants were mostly removed (Figure S17). Optical microscope (OM) and SEM images of the gas sensing devices confirm the high uniformity of FLP film, without significant roughness and voids (Figure 4a). Figure 4b shows the real-time sensing data of P, P/TBAOH, and P/CTAB sensors for 0.125–5 ppm NO2. It is evident that all the sensors show continuously increased response amplitudes as NO2 concentration increases from 0.125 to 5 ppm. In addition, all the sensors presented negative resistance variations onto NO2 oxidizing molecules. Figure 4c shows thermodynamically stable orientation of NO2 adsorbed to phosphorene sheets with an energy of −0.22 eV, which led to the reduction in band gap by 0.09 eV while Fermi level shifts below valence band minima (VBM) (Figure 4d). This indicates that NO2 enhances the p-type character of phosphorene by increasing its hole concentration, thereby decreasing the electrical resistance, as evident from the Bader charge analysis that revealed loss of 0.18e from the phosphorene surface (Figures 4c and S18a,b, Table S4).

Figure 4

Figure 4. (a) Optical microscope and SEM image of FLP based gas sensing device. (b) Resistance variation behaviors of P, P/CTAB, and P/TBAOH over a wide range of NO2 concentration. (c) DFT calculated structure (inset shows binding energy) and charge transfer (inset shows electron loss by phosphorene) between phosphorene and NO2. The isosurface value for all the cases is 0.0005 e/Å3. Isosurface blue and green indicate electron loss and gain, respectively. (d) Density of states of monolayer phosphorene and phosphorene/NO2 (inset shows band gap). Fermi level is fixed at 0 eV. (e, f) Maximum resistance ((ΔR/Rb)max (%)) and response time (τ90%) of each sensor with the variation of NO2 concentration.

While measuring the maximum response variation ((ΔR/Rb)max (%), Figure 4e) and the response time (τ90%, Figure 4f), P/CTAB showed higher response amplitudes (−50% to −70%) for all NO2 concentrations than P and P/TBAOH (−20% to −50%). In terms of response speed, P/CTAB also revealed slightly faster response speed around 60 s. Overall, it is obvious that the intrinsic unique gas sensing property of semiconducting FLP was well maintained after the removal of noncovalently bound surfactants.
Overall, through gas sensing application, we are able to establish two important points: (1) Preservation of unique intrinsic gas sensing property of semiconducting FLP and (2) easy removal of the noncovalently bound surfactants. Unlike covalent functionalization of FLP, our method of protecting FLP from ambient degradation through noncovalent functionalization did not alter the intrinsic properties of FLP. One such property is high absorption energy with NO2 which was preserved after noncovalent functionalization with surfactants. Furthermore, in order to attain high gas sensing property, capping agent should be effectively removed. The process of removing capping agent can deteriorate the property of FLP. However, our method of preparing a gas sensing device, without any further treatment, led to easy removal of bound surfactants without effecting properties of FLP as concluded by observing high gas sensing performance. Therefore, noncovalent functionalization of FLP through surfactants is a perfect model to synthesize FLP sheets with enhanced ambient stability. This model can be further utilized for the synthesis of FLP based field effect transistors, electrocatalyst, and optoelectronic devices, wherein the performance of the devices relies directly on the stability of FLP in ambient condition.

Conclusion

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We have demonstrated an efficient route to the exfoliation and stabilization of FLP by employing surfactants with linear hydrophobic chains and nonbulky ionic headgroups (CTAB). Our approach proposes four principal benefits: (i) efficient exfoliation enabled by the intercalation and strong binding of surfactants at phosphorene, (ii) good aqueous dispersibility along with the interdigitated surfactants arrangement at a high concentration, (iii) suppressed ambient degradation rate by 70–80%, as observed by XPS, and (iv) good protection of intrinsic properties of FLPs after easy surfactant removal. Our surfactant assisted processing suggests a valuable practical platform for facile solution processing as well as effective protection of interesting material properties of phosphorene based materials so as to serve for their genuine potential to fill the gap between graphene and 2D transition metal chalcogenides under practical ambient application conditions.

Supporting Information

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The Supporting Information is available free of charge on the ACS Publications website at DOI: 10.1021/acs.chemmater.8b04984.

  • Experimental methods, supporting figures, tables, discussion, and references. Supporting figures include additional SEM, TEM, AFM, HRTEM, XRD, and STEM of FLPs. Furthermore, additional DFT calculations, partial density of states, Bader charge analysis, 1H NMR, 2D DOSY, additional 2D NOESY, and stability results are presented. Discussion includes detailed information over partial density of states, protonic NMR, 2D DOSY, and 2D NOESY (PDF)

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Most electronic Supporting Information files are available without a subscription to ACS Web Editions. Such files may be downloaded by article for research use (if there is a public use license linked to the relevant article, that license may permit other uses). Permission may be obtained from ACS for other uses through requests via the RightsLink permission system: http://pubs.acs.org/page/copyright/permissions.html.

Author Information

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  • Corresponding Author
    • Sang Ouk Kim - National Creative Research Initiative Centre for Multi-Dimensional Directed Nanoscale Assembly, Department of Materials Science and Engineering, KAIST, Daejeon 34141, Republic of KoreaOrcidhttp://orcid.org/0000-0003-1513-6042 Email: [email protected]
  • Authors
    • Rishabh Jain - National Creative Research Initiative Centre for Multi-Dimensional Directed Nanoscale Assembly, Department of Materials Science and Engineering, KAIST, Daejeon 34141, Republic of KoreaPresent Address: Department of Mechanical, Aerospace, and Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA
    • Yashpal Singh - Graduate School of EEWS, KAIST, Daejeon 34141, Republic of Korea
    • Soo-Yeon Cho - Department of Chemical and Biomolecular Engineering, KAIST, Daejeon 34141, Republic of Korea
    • Suchithra Padmajan Sasikala - National Creative Research Initiative Centre for Multi-Dimensional Directed Nanoscale Assembly, Department of Materials Science and Engineering, KAIST, Daejeon 34141, Republic of Korea
    • Sung Hwan Koo - National Creative Research Initiative Centre for Multi-Dimensional Directed Nanoscale Assembly, Department of Materials Science and Engineering, KAIST, Daejeon 34141, Republic of Korea
    • Rekha Narayan - National Creative Research Initiative Centre for Multi-Dimensional Directed Nanoscale Assembly, Department of Materials Science and Engineering, KAIST, Daejeon 34141, Republic of Korea
    • Hee-Tae Jung - Department of Chemical and Biomolecular Engineering, KAIST, Daejeon 34141, Republic of KoreaOrcidhttp://orcid.org/0000-0002-5727-6732
    • Yousung Jung - Graduate School of EEWS, KAIST, Daejeon 34141, Republic of KoreaOrcidhttp://orcid.org/0000-0003-2615-8394
  • Notes
    The authors declare no competing financial interest.

Acknowledgments

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This work was supported by the National Creative Research Initiative (CRI) Center for Multi-Dimensional Directed Nanoscale Assembly (2015R1A3A2033061) and the Nano Material Technology Development Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT and Future Planning (2016M3A7B4905609).

References

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  • Abstract

    Figure 1

    Figure 1. (a) Schematic procedure for the fabrication of FLPs. Photographical image shows aqueous dispersibility of FLP in different concentrations of surfactant. (b) TEM image of P/CTAB (inset shows SEM image; 400 nm scale). (c) HRTEM image of P/CTAB (inset shows SAED pattern). (d) Raman spectroscopy of FLP exfoliated in various surfactant media. (e) Variation in zeta potential of FLP with surfactant concentration. (f, g) XRD patterns of exfoliated P and P/CTAB (low and high conc.).

    Figure 2

    Figure 2. (a, b) DFT calculated structures of thermodynamically favored noncovalent binding of (a) CTAB and (b) TBAOH surfactants at phosphorene surface (insets show binding energies value). (c, d) 2D NOESY spectra of (c) P/CTAB, and (d) P/TBAOH dispersions in D2O. Assignments of resonances are indicated. Structures of (e) CTAB and (f) TBAOH representing various types of 1H protons present.

    Figure 3

    Figure 3. (a–f) SEM images of P/CTAB when exposed to ambient condition over 35 days. (g–i) XPS analysis of (g) P, (h) P/CTAB), (i) P/TBAOH when exposed to ambient condition over 21 days. Inset shows XPS analysis of oxidized phosphorene (POx) for 21 days. (j) Quantitative analysis of degradation rate in P (black), P/CTAB (red), and P/TBAOH (inset, blue) for 21 days.

    Figure 4

    Figure 4. (a) Optical microscope and SEM image of FLP based gas sensing device. (b) Resistance variation behaviors of P, P/CTAB, and P/TBAOH over a wide range of NO2 concentration. (c) DFT calculated structure (inset shows binding energy) and charge transfer (inset shows electron loss by phosphorene) between phosphorene and NO2. The isosurface value for all the cases is 0.0005 e/Å3. Isosurface blue and green indicate electron loss and gain, respectively. (d) Density of states of monolayer phosphorene and phosphorene/NO2 (inset shows band gap). Fermi level is fixed at 0 eV. (e, f) Maximum resistance ((ΔR/Rb)max (%)) and response time (τ90%) of each sensor with the variation of NO2 concentration.

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