Atomic Resolution Imaging with a sub-50 pm Electron Probe
Description
Using a highly coherent focused electron probe in a 5th order aberration-corrected transmission electron microscope, we report on resolving a crystal spacing less than 50 pm. Based on the geometrical source size and residual coherent and incoherent axial lens aberrations, an electron probe is calculated, which is theoretically capable of resolving an ideal 47 pm spacing with 29percent contrast. Our experimental data show the 47 pm spacing of a Ge 114 crystal imaged with 11-18percent contrast at a 60-95percent confidence level, providing the first direct evidence for sub 50-pm resolution in ADF STEM imaging.
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Erni, Rolf P.; Rossell, Marta D.; Kisielowski, Christian & Dahmen, Ulrich March 2, 2009.
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- Lawrence Berkeley Laboratory. Materials and Molecular Research Division. Materials Sciences Division
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- Lawrence Berkeley National Laboratory
Publisher Info: Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (United States)Place of Publication: Berkeley, California
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Using a highly coherent focused electron probe in a 5th order aberration-corrected transmission electron microscope, we report on resolving a crystal spacing less than 50 pm. Based on the geometrical source size and residual coherent and incoherent axial lens aberrations, an electron probe is calculated, which is theoretically capable of resolving an ideal 47 pm spacing with 29percent contrast. Our experimental data show the 47 pm spacing of a Ge 114 crystal imaged with 11-18percent contrast at a 60-95percent confidence level, providing the first direct evidence for sub 50-pm resolution in ADF STEM imaging.
Physical Description
4
Subjects
Keywords
- Aberration Correction, Stem, Resolution
- Electron Microscopes
- Electron Probes
- Resolution Aberration Correction, Stem, Resolution
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- Journal Name: Physical Review Letters; Journal Volume: 102; Related Information: Journal Publication Date: 03/02/2009
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- Report No.: LBNL-1908E
- Grant Number: DE-AC02-05CH11231
- Office of Scientific & Technical Information Report Number: 960283
- Archival Resource Key: ark:/67531/metadc927376
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- March 2, 2009
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- Nov. 13, 2016, 7:26 p.m.
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- Oct. 2, 2017, 5:03 p.m.
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Erni, Rolf P.; Rossell, Marta D.; Kisielowski, Christian & Dahmen, Ulrich. Atomic Resolution Imaging with a sub-50 pm Electron Probe, article, March 2, 2009; Berkeley, California. (https://digital.library.unt.edu/ark:/67531/metadc927376/: accessed April 26, 2024), University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.