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Materials Advances through Aberration-Corrected Electron Microscopy

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Abstract

Over the last few years, the performance of electron microscopes has undergone a dramatic improvement, with achievable resolution having more than doubled. It is now possible to probe individual atomic sites in many materials and to determine atomic and electronic structure with single-atom sensitivity. This revolution has been enabled by the successful correction of the dominant aberrations present in electron lenses. In this review, the authors present a brief overview of these instrumental advances, emphasizing the new insights they provide to several areas of materials research.

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Authors
  1. S. J. Pennycook
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  2. M. Varela
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  3. C. J. D. Hetherington
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  4. A. I. Kirkland
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Pennycook, S.J., Varela, M., Hetherington, C.J.D. et al. Materials Advances through Aberration-Corrected Electron Microscopy. MRS Bulletin 31, 36–43 (2006). https://doi.org/10.1557/mrs2006.4

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