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Measurement of the Elastic Properties and Intrinsic Strength of Monolayer Graphene

Science
18 Jul 2008
Vol 321, Issue 5887
pp. 385-388

Abstract

We measured the elastic properties and intrinsic breaking strength of free-standing monolayer graphene membranes by nanoindentation in an atomic force microscope. The force-displacement behavior is interpreted within a framework of nonlinear elastic stress-strain response, and yields second- and third-order elastic stiffnesses of 340 newtons per meter (N m–1) and –690 Nm–1, respectively. The breaking strength is 42 N m–1 and represents the intrinsic strength of a defect-free sheet. These quantities correspond to a Young's modulus of E = 1.0 terapascals, third-order elastic stiffness of D = –2.0 terapascals, and intrinsic strength of σint = 130 gigapascals for bulk graphite. These experiments establish graphene as the strongest material ever measured, and show that atomically perfect nanoscale materials can be mechanically tested to deformations well beyond the linear regime.

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We thank S. Berciaud for Raman spectroscopy of the graphene samples, Namiki Inc. for AFM cantilevers, and J. Hay and W. Oliver (MTS Nano Instruments) for useful interactions. We acknowledge support from NSF under awards CHE-0117752, CMMI-0500239, and DMR-0650555; iMINT (Award HR0011-06-1-0048); Air Force Office of Scientific Research grant FA9550-06-1-0214; and New York State Office of Science, Technology, and Academic Research. This work used shared experimental facilities supported primarily by the Materials Research Science and Engineering Center Program of NSF under award DMR-0213574, and the Cornell Nanoscale Science and Technology Facility, a member of the National Nanotechnology Infrastructure Network, which is supported by NSF (ECS-0335765).

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Published In

Science
Volume 321 | Issue 5887
18 July 2008

Submission history

Received: 18 March 2008
Accepted: 11 June 2008
Published in print: 18 July 2008

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Notes

Supporting Online Material
www.sciencemag.org/cgi/content/full/321/5887/385/DC1
Materials and Methods
Figs. S1 to S8
References

Authors

Affiliations

Changgu Lee
Department of Mechanical Engineering, Columbia University, New York, NY 10027, USA.
Defense Advanced Research Projects Agency Center for Integrated Micro/Nano-Electromechanical Transducers (iMINT), Columbia University, New York, NY 10027, USA.
Xiaoding Wei
Department of Mechanical Engineering, Columbia University, New York, NY 10027, USA.
Jeffrey W. Kysar
Department of Mechanical Engineering, Columbia University, New York, NY 10027, USA.
Center for Nanostructured Materials, Columbia University, New York, NY 10027, USA.
James Hone* [email protected]
Department of Mechanical Engineering, Columbia University, New York, NY 10027, USA.
Defense Advanced Research Projects Agency Center for Integrated Micro/Nano-Electromechanical Transducers (iMINT), Columbia University, New York, NY 10027, USA.
Center for Electronic Transport in Molecular Nanostructures, Columbia University, New York, NY 10027, USA.

Notes

*
To whom correspondence should be addressed. E-mail: [email protected]

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