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Hysteresis-Free Contact Doping for High-Performance Two-Dimensional Electronics

  • Po-Hsun Ho*
    Po-Hsun Ho
    Department of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan
    Center of Atomic Initiative for New Materials, National Taiwan University, Taipei 106, Taiwan
    *[email protected] (Dr. Po-Hsun Ho).
    More by Po-Hsun Ho
  • Jun-Ru Chang
    Jun-Ru Chang
    Department of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan
    More by Jun-Ru Chang
  • Chun-Hsiang Chen
    Chun-Hsiang Chen
    Department of Physics, National Taiwan University, Taipei 106, Taiwan
  • Cheng-Hung Hou
    Cheng-Hung Hou
    Research Center for Applied Sciences, Academia Sinica, Taipei 11529, Taiwan
    More by Cheng-Hung Hou
  • Chun-Hao Chiang
    Chun-Hao Chiang
    Department of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan
    More by Chun-Hao Chiang
  • Min-Chuan Shih
    Min-Chuan Shih
    Department of Physics, National Taiwan University, Taipei 106, Taiwan
    More by Min-Chuan Shih
  • Hung-Chang Hsu
    Hung-Chang Hsu
    Department of Physics, National Taiwan University, Taipei 106, Taiwan
    More by Hung-Chang Hsu
  • Wen-Hao Chang
    Wen-Hao Chang
    Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu 300, Taiwan
    More by Wen-Hao Chang
  • Jing-Jong Shyue
    Jing-Jong Shyue
    Research Center for Applied Sciences, Academia Sinica, Taipei 11529, Taiwan
    More by Jing-Jong Shyue
  • Ya-Ping Chiu*
    Ya-Ping Chiu
    Department of Physics, National Taiwan University, Taipei 106, Taiwan
    Center of Atomic Initiative for New Materials, National Taiwan University, Taipei 106, Taiwan
    *[email protected] (Prof. Ya-Ping Chiu).
    More by Ya-Ping Chiu
  • , and 
  • Chun-Wei Chen*
    Chun-Wei Chen
    Department of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan
    Center of Atomic Initiative for New Materials, National Taiwan University, Taipei 106, Taiwan
    *[email protected] (Prof. Chun-Wei Chen).
    More by Chun-Wei Chen
Cite this: ACS Nano 2023, 17, 3, 2653–2660
Publication Date (Web):January 30, 2023
https://doi.org/10.1021/acsnano.2c10631
Copyright © 2023 American Chemical Society

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    Abstract

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    Contact doping is considered crucial for reducing the contact resistance of two-dimensional (2D) transistors. However, a process for achieving robust contact doping for 2D electronics is lacking. Here, we developed a two-step doping method for effectively doping 2D materials through a defect-repairing process. The method achieves strong and hysteresis-free doping and is suitable for use with the most widely used transition-metal dichalcogenides. Through our method, we achieved a record-high sheet conductance (0.16 mS·sq–1 without gating) of monolayer MoS2 and a high mobility and carrier concentration (4.1 × 1013 cm–2). We employed our robust method for the successful contact doping of a monolayer MoS2 Au-contact device, obtaining a contact resistance as low as 1.2 kΩ·μm. Our method represents an effective means of fabricating high-performance 2D transistors.

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    The Supporting Information is available free of charge at https://pubs.acs.org/doi/10.1021/acsnano.2c10631.

    • Additional doping result of a high-concentration base, photoluminescence spectra, doping result of NMP-TMAH, XPS spectra, doping concentration extraction, log plots of devices, TLM method, and temperature-dependent characteristics of devices (PDF)

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    Cited By

    This article is cited by 2 publications.

    1. Bingjie Liu, Xiaofei Yue, Chenxu Sheng, Jiajun Chen, Chengjie Tang, Yabing Shan, Jinkun Han, Shuwen Shen, Wenxuan Wu, Lijia Li, Ye Lu, Laigui Hu, Ran Liu, Zhi-Jun Qiu, Chunxiao Cong. High-Performance Contact-Doped WSe2 Transistors Using TaSe2 Electrodes. ACS Applied Materials & Interfaces 2024, 16 (15) , 19247-19253. https://doi.org/10.1021/acsami.4c01605
    2. Po-Hsun Ho, Yu-Ying Yang, Sui-An Chou, Ren-Hao Cheng, Po-Heng Pao, Chao-Ching Cheng, Iuliana Radu, Chao-Hsin Chien. High-Performance WSe2 Top-Gate Devices with Strong Spacer Doping. Nano Letters 2023, 23 (22) , 10236-10242. https://doi.org/10.1021/acs.nanolett.3c02757

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